Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...
The rapid advancement of 2D materials (2DMs), such as graphene, transition metal dichalcogenides (TMDs), and hexagonal boron nitride (hBN), has revolutionized the field of nanotechnology and ...
In this study, metal contaminants, liquid particle count and on-wafer defects of Si- HMs and filtration removal rates are monitored to determine the effect of filter type, pore size, media morphology, ...
The Department of Energy Solar Energy Technologies Office announced it selected the University of Arizona to develop a new method for identifying defects in perovskite solar cell development during ...
image: THE INTRODUCTION OF DEFECTS INTO ELECTRODE MATERIALS FOR METAL-BASED BATTERIES IS AN EFFECTIVE STRATEGY TO IMPROVE BATTERY PERFORMANCE, DUE TO DEFECTIVE CATALYSTS HAVE THE ADVANTAGES OF HIGH ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
Residual processing defects significantly reduce fused silica optics' laser-induced damage threshold (LIDT), which seriously limits their performance and lifetime in high-energy laser applications.
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