As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Over the last few years, design-for-test (DFT) chip-testing techniques such as internal scan (ISCAN), automatic test-pattern generation (ATPG), built-in self-test (BIST), and boundary scan (BSCAN) ...

At this year’s International Test Conference (October 10-15, 2021), Siemens Digital Industries Software is showcasing IC test and lifecycle management technologies that address the key scaling ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...