The SFP1 surface-finish probe makes the REVO five-axis CMM head function as a “single platform” metrology system, with a surface-finish measurement capability of 6.3-0.05 Ra. The new SFP1 probe option ...
Being able to quantify a surface finish is both a complex and necessary task. While surface topography relates to a three-dimensional property, the most accepted surface measurement parameter is ...
This article explains the benefits of the non-contact inspection method used by 3D optical profilers, and outlines the best practices and measurement results for some specialized PTB ...
The complexities of nanoscale surface measurement are anything but nano-sized. With the advancement of nanotechnology, nanoscale surface measurement is an integral part of the development of this ever ...
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