A steady stream of advances has elevated test and measurement instruments to the point where they can reveal minute details of signals with lightning-quick rise and fall times. So, then, what about ...

Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the ...

One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...